Novel approaches for the characterization of electromagnetic fields using electron holography

Abstract

ABSTRACTTwo recent developments related to the application of off-axis electron holography to the characterization of magnetic and electrostatic fields in nanoscale materials and devices are described. The first is based on the design and implementation of a three-contact electrical biasing specimen holder that allows electron holograms to be recorded from samples as they are tilted to angles of up to ±70° with voltages applied to them in situ in the electron microscope. The second relates to the prospect of characterizing magnetic vector fields in materials in three dimensions using electron holography.