Author:
Eckstein R.,Hofmann D.,Makarov Y.,Müller St. G.,Pensl G.,Schmitt E.,Winnacker A.
Abstract
AbstractExperimental and numerical analysis have been performed on the sublimation growth process of SiC bulk crystals. Crystallographic, electrical and optical properties of the grown silicon carbide (SIC) crystals have been evaluated by various characterization techniques. Numerical models for the global simulation of SiC bulk growth including heat and mass transfer and chemical processes are applied and experimentally verified.
Publisher
Springer Science and Business Media LLC
Cited by
18 articles.
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