Author:
Bocelli S.,Guizzetti G.,Marabelli F.,Hatziconstantinidou S.,Petersson C.S.
Abstract
AbstractSpecular and diffuse reflectance and spectroscopic ellipsometry were used to characterize a series of Cosi2 films obtained by heat treatment on a Co/Ti bilayer. The surface quality is strongly affected by etching procedures. The intrinsic optical properties of the CoSi2 film exhibit a small dependence on the growth technique.
Publisher
Springer Science and Business Media LLC