Picosecond Transient Reflectance Measurements of Crystallization In Pure Metals-Reference-Cited by-同舟云学术

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Picosecond Transient Reflectance Measurements of Crystallization In Pure Metals

Published:1985 Issue: Volume:51 Page:
ISSN:0272-9172
Container-title:MRS Proceedings
language:en
Short-container-title:MRS Proc.

Author:

MacDonald C.A.,Malvezzi A.M.,Spaepen F.

Abstract

ABSTRACTThe kinetics of rapid crystallization in metals is investigated by measuring transient optical property changes in laser irradiated gold and copper films in the picosecond and nanosecond regimes. Melt thresholds are determined by examining concentration profiles of multi-layered films before and after irradiation.

Publisher

Springer Science and Business Media LLC

Subject

General Engineering

Reference16 articles.

1. 11. Brown W.L. in ref.1, p.9.

2. Ion beam sputtering apparatus for fabrication of compositionally modulated materials

3. Measurement of the optical constants of Al above the melting point at λ=10.6 μm

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Pulsed UV laser ablation of a liquid crystal polymer;The International Journal of Advanced Manufacturing Technology;2005-01-12

2. Topographical and surface chemical characterization of nanosecond pulsed-laser micromachining of titanium at 532-nm wavelength;Applied Physics A;2003-08

3. Formation of Metastable Nb–Si Phases by Picosecond and Nanosecond Pulsed Laser Quenching;Rapidly Quenched Metals 6;1988

4. Thermodynamics and Kinetics of Melting, Evaporation and Crystallization, Induced by Picosecond Pulsed Laser Irradiation;Springer Series in Chemical Physics;1986

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