1. 10 Miyao M. , Moniwa M. , Ichikawa M. , Ishizaka A. , Doi T. , Sunami H. , and Tokuyama T. , in the Extended Abstracts of the 16th International Conference on Solid State Devices and Materials, Kobe, 1984, p. 511.
2. 9 Natsuaki N. , Tamura T. , Miyazaki T. , and Yanagi Y. , in the Proceedings of the 15th Conference on Solid State Devices and Materials, Tokyo, 1983, p. 47.
3. Concepts of Backscattering Spectrometry
4. ‘Shock-crystallization’ on the basis of a domino-type model
5. Pulsed excimer (KrF) laser melting of amorphous and crystalline silicon layers