Author:
Whitehouse C.R.,Mcconville C.F.,Williams G.M.,Cullis A.G.,Barnett S.J.,Saker M.K.,Skolnick M.S.,Pitt A.D.
Abstract
ABSTRACTThe MBE growth and related materials characterisation of InSb/InAlSb strained-layer structures is described. Band-gap considerations and critical thickness calculations are presented and indicate that this material system should offer considerable device potential. Detailed structural studies, performed using both transmission electron microscopy and X-ray diffraction, confirm the growth of high quality multiple quantum-wells, and 2K photoluminescence has shown corresponding energy upshifted transitions.
Publisher
Springer Science and Business Media LLC
Cited by
7 articles.
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