Fast and Accurate Facial Expression Image Classification and Regression Method Based on Knowledge Distillation

Author:

Lee Kunyoung1ORCID,Kim Seunghyun2,Lee Eui Chul3ORCID

Affiliation:

1. Department of Computer Science, Graduate School, Sangmyung University, Seoul 03016, Republic of Korea

2. Department of AI & Informatics, Graduate School, Sangmyung University, Seoul 03016, Republic of Korea

3. Department of Human-Centered Artificial Intelligence, Sangmyung University, Seoul 03016, Republic of Korea

Abstract

As emotional states are diverse, simply classifying them through discrete facial expressions has its limitations. Therefore, to create a facial expression recognition system for practical applications, not only must facial expressions be classified, emotional changes must be measured as continuous values. Based on the knowledge distillation structure and the teacher-bounded loss function, we propose a method to maximize the synergistic effect of jointly learning discrete and continuous emotional states of eight expression classes, valences, and arousal levels. The proposed knowledge distillation model uses Emonet, a state-of-the-art continuous estimation method, as the teacher model, and uses a lightweight network as the student model. It was confirmed that performance degradation can be minimized even though student models have multiply-accumulate operations of approximately 3.9 G and 0.3 G when using EfficientFormer and MobileNetV2, respectively, which is much less than the amount of computation required by the teacher model (16.99 G). Together with the significant improvements in computational efficiency (by 4.35 and 56.63 times using EfficientFormer and MobileNetV2, respectively), the decreases in facial expression classification accuracy were approximately 1.35% and 1.64%, respectively. Therefore, the proposed method is optimized for application-level interaction systems in terms of both the amount of computation required and the accuracy.

Publisher

MDPI AG

Subject

Fluid Flow and Transfer Processes,Computer Science Applications,Process Chemistry and Technology,General Engineering,Instrumentation,General Materials Science

Reference31 articles.

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4. Szegedy, C., Liu, W., Jia, Y., Sermanet, P., Reed, S., Anguelov, D., Erhan, D., Vanhoucke, V., and Rabinovich, A. (2015, January 7–12). Going Deeper with Convolutions. Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (CVPR), Boston, MA, USA.

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