A Lightweight Method for Detecting IC Wire Bonding Defects in X-ray Images

Abstract

Integrated circuit (IC) X-ray wire bonding image inspections are crucial for ensuring the quality of packaged products. However, detecting defects in IC chips can be challenging due to the slow defect detection speed and the high energy consumption of the available models. In this paper, we propose a new convolutional neural network (CNN)-based framework for detecting wire bonding defects in IC chip images. This framework incorporates a Spatial Convolution Attention (SCA) module to integrate multi-scale features and assign adaptive weights to each feature source. We also designed a lightweight network, called the Light and Mobile Network (LMNet), using the SCA module to enhance the framework’s practicality in the industry. The experimental results demonstrate that the LMNet achieves a satisfactory balance between performance and consumption. Specifically, the network achieved a mean average precision (mAP50) of 99.2, with 1.5 giga floating-point operations (GFLOPs) and 108.7 frames per second (FPS), in wire bonding defect detection.