Resonant Excitation of the Ferroelectric Soft Mode by a Narrow-Band THz Pulse

Author:

Brekhov Kirill1ORCID,Bilyk Vladislav2,Ovchinnikov Andrey3ORCID,Chefonov Oleg3ORCID,Mukhortov Vladimir4,Mishina Elena1ORCID

Affiliation:

1. Department of Nanoelectronics, MIREA—Russian Technological University, Moscow 119454, Russia

2. Institute for Molecules and Materials, Radboud University, 6525 AJ Nijmegen, The Netherlands

3. Joint Institute for High Temperatures of Russian Academy of Sciences (JIHT), Moscow 125412, Russia

4. Southern Scientific Center of Russian Academy of Sciences, Rostov-on-Don 344006, Russia

Abstract

This study investigates the impact of narrow-band terahertz pulses on the ferroelectric order parameter in Ba0.8Sr0.2TiO3 films on various substrates. THz radiation in the range of 1–2 THz with the pulse width of about 0.15 THz was separated from a broadband pulse with the interference technique. The 375 nm thick BST film on a MgO (001) substrate exhibits enhanced THz-induced second harmonic generation when excited by THz pulses with a central frequency of 1.6 THz, due to the resonant excitation of the soft phonon mode. Conversely, the BST film on a Si (001) substrate shows no enhancement, due to its polycrystalline state. The 800 nm thick BST film on a MgO (111) substrate demonstrates the maximum of a second harmonic generation signal when excited by THz pulses at 1.8 THz, which is close to the soft mode frequency for the (111) orientation. Notably, the frequency spectrum of the BST/MgO (111) film reveals peaks at both the fundamental and doubled frequencies, and their intensities depend, respectively, linearly and quadratically on the THz pulse electric field strength.

Funder

Russian Science Foundation

Publisher

MDPI AG

Subject

General Materials Science,General Chemical Engineering

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