A Sequential Inspection Procedure for Fault Detection in Multistage Manufacturing Processes

Author:

Moliner-Heredia RubénORCID,Bruscas-Bellido Gracia M.,Abellán-Nebot José V.ORCID,Peñarrocha-Alós IgnacioORCID

Abstract

Fault diagnosis in multistage manufacturing processes (MMPs) is a challenging task where most of the research presented in the literature considers a predefined inspection scheme to identify the sources of variation and make the process diagnosable. In this paper, a sequential inspection procedure to detect the process fault based on a sequential testing algorithm and a minimum monitoring system is proposed. After the monitoring system detects that the process is out of statistical control, the features to be inspected (end of line or in process measurements) are defined sequentially according to the expected information gain of each potential inspection measurement. A case study is analyzed to prove the benefits of this approach with respect to a predefined inspection scheme and a randomized sequential inspection considering both the use and non-use of fault probabilities from historical maintenance data.

Funder

Jaume I University

Publisher

MDPI AG

Subject

Electrical and Electronic Engineering,Biochemistry,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Challenges for Predictive Quality in Multi-stage Manufacturing: Insights from Literature Review;Proceedings of the 3rd International Workshop on Software Engineering and AI for Data Quality in Cyber-Physical Systems/Internet of Things;2023-12-04

2. A New Statistical Features Based Approach for Bearing Fault Diagnosis Using Vibration Signals;Sensors;2022-03-04

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