Affiliation:
1. Faculty of Electrical Engineering, Warsaw University of Technology, Pl. Politechniki 1, 00-661 Warsaw, Poland
Abstract
One approach employed in brain–computer interfaces (BCIs) involves the use of steady-state visual evoked potentials (SSVEPs). This article examines the capability of artificial intelligence, specifically convolutional neural networks (CNNs), to improve SSVEP detection in BCIs. Implementing CNNs for this task does not require specialized knowledge. The subsequent layers of the CNN extract valuable features and perform classification. Nevertheless, a significant number of training examples are typically required, which can pose challenges in the practical application of BCI. This article examines the possibility of using a CNN in combination with data augmentation to address the issue of a limited training dataset. The data augmentation method that we applied is based on the spectral analysis of the electroencephalographic signals (EEG). Initially, we constructed the spectral representation of the EEG signals. Subsequently, we generated new signals by applying random amplitude and phase variations, along with the addition of noise characterized by specific parameters. The method was tested on a set of real EEG signals containing SSVEPs, which were recorded during stimulation by light-emitting diodes (LEDs) at frequencies of 5, 6, 7, and 8 Hz. We compared the classification accuracy and information transfer rate (ITR) across various machine learning approaches using both real training data and data generated with our augmentation method. Our proposed augmentation method combined with a convolutional neural network achieved a high classification accuracy of 0.72. In contrast, the linear discriminant analysis (LDA) method resulted in an accuracy of 0.59, while the canonical correlation analysis (CCA) method yielded 0.57. Additionally, the proposed approach facilitates the training of CNNs to perform more effectively in the presence of various EEG artifacts.
Subject
Fluid Flow and Transfer Processes,Computer Science Applications,Process Chemistry and Technology,General Engineering,Instrumentation,General Materials Science