Deciphering the Host–Pathogen Interactome of the Wheat–Common Bunt System: A Step towards Enhanced Resilience in Next Generation Wheat

Abstract

Common bunt, caused by two fungal species, Tilletia caries and Tilletia laevis, is one of the most potentially destructive diseases of wheat. Despite the availability of synthetic chemicals against the disease, organic agriculture relies greatly on resistant cultivars. Using two computational approaches—interolog and domain-based methods—a total of approximately 58 M and 56 M probable PPIs were predicted in T. aestivum–T. caries and T. aestivum–T. laevis interactomes, respectively. We also identified 648 and 575 effectors in the interactions from T. caries and T. laevis, respectively. The major host hubs belonged to the serine/threonine protein kinase, hsp70, and mitogen-activated protein kinase families, which are actively involved in plant immune signaling during stress conditions. The Gene Ontology (GO) and Kyoto Encyclopedia of Genes and Genomes (KEGG) enrichment analysis of the host proteins revealed significant GO terms (O-methyltransferase activity, regulation of response to stimulus, and plastid envelope) and pathways (NF-kappa B signaling and the MAPK signaling pathway) related to plant defense against pathogens. Subcellular localization suggested that most of the pathogen proteins target the host in the plastid. Furthermore, a comparison between unique T. caries and T. laevis proteins was carried out. We also identified novel host candidates that are resistant to disease. Additionally, the host proteins that serve as transcription factors were also predicted.