Advancing Leaf Nutritional Characterization of Blueberry Varieties Adapted to Warm Climates Enhanced by Proximal Sensing

Author:

Silva Sérgio H. G.1ORCID,Berardo Marcelo C.2,Rosado Lucas R.1,Andrade Renata1ORCID,Teixeira Anita F. S.3ORCID,Duarte Mariene H.1,Bócoli Fernanda A.1ORCID,Carneiro Marco A. C.1,Curi Nilton1

Affiliation:

1. Department of Soil Science, Federal University of Lavras, Lavras 37200-900, MG, Brazil

2. Faculdades Londrina, Av. Duque de Caxias, 450, Centro Cívico, Londrina 86015-000, PR, Brazil

3. Department of Agriculture, Federal University of Lavras, Lavras 37200-900, MG, Brazil

Abstract

Blueberries offer multiple health benefits, and their cultivation has expanded to warm tropical regions. However, references for foliar nutritional content are lacking in the literature. Proximal sensing may enhance nutritional characterization to optimize blueberry production. We aimed (i) to characterize the nutrient contents of healthy plants of three blueberry varieties adapted to warm climates (Emerald, Jewel, and Biloxi) using a reference method for foliar analysis (inductively coupled plasma (ICP)) and a portable X-ray fluorescence (pXRF) spectrometer on fresh and dry leaves and (ii) to differentiate blueberry varieties based on their nutrient composition. Nutrient content was statistically compared per leaf moisture condition (fresh or dry) with ICP results and used to differentiate the varieties via the random forest algorithm. P and Zn contents (ICP) in leaves were different among varieties. Dry leaf results (pXRF) were strongly correlated with ICP results. Most nutrients determined using ICP presented good correlation with pXRF data (R2 from 0.66 to 0.93). The three varieties were accurately differentiated by pXRF results (accuracy: 87%; kappa: 0.80). Predictions of nutrient contents based on dry leaves analyzed by pXRF outperformed those based on fresh leaves. This approach can also be applied to other crops to facilitate nutrient assessment in leaves.

Funder

National Council for Scientific and Technological Development

Fundação de Amparo à Pesquisa do Estado de Minas Gerais

Publisher

MDPI AG

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