Model-Based Correction of Temperature-Dependent Measurement Errors in Frequency Domain Electromagnetic Induction (FDEMI) Systems

Author:

Tazifor MartialORCID,Zimmermann EgonORCID,Huisman Johan AlexanderORCID,Dick Markus,Mester Achim,Van Waasen Stefan

Abstract

Data measured using electromagnetic induction (EMI) systems are known to be susceptible to measurement influences associated with time-varying external ambient factors. Temperature variation is one of the most prominent factors causing drift in EMI data, leading to non-reproducible measurement results. Typical approaches to mitigate drift effects in EMI instruments rely on a temperature drift calibration, where the instrument is heated up to specific temperatures in a controlled environment and the observed drift is determined to derive a static thermal apparent electrical conductivity (ECa) drift correction. In this study, a novel correction method is presented that models the dynamic characteristics of drift using a low-pass filter (LPF) and uses it for correction. The method is developed and tested using a customized EMI device with an intercoil spacing of 1.2 m, optimized for low drift and equipped with ten temperature sensors that simultaneously measure the internal ambient temperature across the device. The device is used to perform outdoor calibration measurements over a period of 16 days for a wide range of temperatures. The measured temperature-dependent ECa drift of the system without corrections is approximately 2.27 mSm−1K−1, with a standard deviation (std) of only 30 μSm−1K−1 for a temperature variation of around 30 K. The use of the novel correction method reduces the overall root mean square error (RMSE) for all datasets from 15.7 mSm−1 to a value of only 0.48 mSm−1. In comparison, a method using a purely static characterization of drift could only reduce the error to an RMSE of 1.97 mSm−1. The results show that modeling the dynamic thermal characteristics of the drift helps to improve the accuracy by a factor of four compared to a purely static characterization. It is concluded that the modeling of the dynamic thermal characteristics of EMI systems is relevant for improved drift correction.

Publisher

MDPI AG

Subject

Electrical and Electronic Engineering,Biochemistry,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

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