Investigation of Amorphous Carbon in Nanostructured Carbon Materials (A Comparative Study by TEM, XPS, Raman Spectroscopy and XRD)

Abstract

Amorphous carbon (AC) is present in the bulk and on the surface of nanostructured carbon materials (NCMs) and exerts a significant effect on the physical, chemical and mechanical properties of NCMs. Thus, the determination of AC in NCMs is extremely important for controlling the properties of a wide range of materials. In this work, a comparative study of the effect of heat treatment on the structure and content of amorphous carbon in deposited AC film, nanodiamonds, carbon black and multiwalled carbon nanotube samples was carried out by TEM, XPS, XRD and Raman spectroscopy. It has been established that the use of the 7-peak model for fitting the Raman spectra makes it possible not only to isolate the contribution of the modes of amorphous carbon but also to improve the accuracy of fitting the fundamental G and D2 (D) modes and obtain a satisfactory convergence between XPS and Raman spectroscopy. The use of this model for fitting the Raman spectra of deposited AC film, ND, CB and MWCNT films demonstrated its validity and effectiveness for investigating the amorphous carbon in various carbon systems and its applicability in comparative studies of other NCMs.