Contactless Method for Measurement of Surface Roughness Based on a Chromatic Confocal Sensor

Author:

Lishchenko Natalia1,O’Donnell Garret E.1,Culleton Mark1

Affiliation:

1. Department of Mechanical, Manufacturing and Biomedical Engineering, Trinity College Dublin, College Green, Dublin 2, D02 PN40 Dublin, Ireland

Abstract

The methodology for assigning and assessing the surface quality is used at various stages of the product life cycle: during the design and technological preparation of production, the production itself, and during the control (testing) of products. The development of advanced technologies requires in situ part control. A non-contact in situ surface roughness measuring system is proposed in this paper. The proposed system utilizes a chromatic confocal sensor, and profile data, waviness data, roughness data, Ra, and Rz parameters are generated in the developed data-processing software. The assembled measuring system based on the chromatic confocal laser sensor showed its performance in assessing the roughness parameter Ra, from 0.34 µm to more than 12 µm, which covers a common range of milling, turning, and grinding. In this range, measurement relative errors can be controlled within 10%. Frequency analysis and correlation analysis of profilograms were performed. Frequency analysis made it possible to establish the dominant frequency components that occur in the profilogram of the samples, while correlation analysis was used to develop a methodology for identifying the deterministic and random components of the processed surface profile signal. The results of the analysis can be further used to develop diagnostic functions for process monitoring based on profilogram estimates, such as the autocorrelation function and the power spectrum density.

Funder

Enterprise Ireland

European Commission under the Horizon 2020 Marie Skłodowska-Curie Actions

Publisher

MDPI AG

Subject

Electrical and Electronic Engineering,Industrial and Manufacturing Engineering,Control and Optimization,Mechanical Engineering,Computer Science (miscellaneous),Control and Systems Engineering

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