Author:
Hrabina Jan,Lazar Josef,Holá Miroslava,Číp Ondřej
Subject
Electrical and Electronic Engineering,Biochemistry,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry
Reference51 articles.
1. Design and characterization of MIKES metrological atomic force microscope;Korpelainen;Precis. Eng.,2010
2. A nanopositioning and nanomeasuring machine: Operation-measured results;Jäger;Nanotechnol. Precis. Eng.,2004
3. Multiaxis interferometric displacement measurement for local probe microscopy;Lazar;Cent. Eur. J. Phys.,2012
4. Measurement of microscope calibration standards in nanometrology using a metrological atomic force microscope;Kim;Meas. Sci. Technol.,2006
5. Multidimensional interferometric tool for the local probe microscopy nanometrology;Hrabina;Meas. Sci. Technol.,2011
Cited by
28 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献