A Study of Quantum Confinement Effects in Ultrathin NiO Films Performed by Experiment and Theory-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

A Study of Quantum Confinement Effects in Ultrathin NiO Films Performed by Experiment and Theory

Published:2018-06-04 Issue:6 Volume:11 Page:949
ISSN:1996-1944
Container-title:Materials
language:en
Short-container-title:Materials

Author:

Garoufalis Christos,Barnasas Alexandros,Stamatelatos Alkeos,Karoutsos Vagelis,Grammatikopoulos Spyridon,Poulopoulos Panagiotis,Baskoutas Sotirios

Publisher

MDPI AG

Subject

General Materials Science

Link

http://www.mdpi.com/1996-1944/11/6/949/pdf

Reference47 articles.

1. Optical Properties of NiO and CoO

2. Sensing characteristics of NiO thin films as NO2 gas sensor

3. Nano- and mesoscale modeling of cement matrix

4. Resistive switching characteristics of thin NiO film based flexible nonvolatile memory devices

5. Thin (NiO)1−x(Al2O3)x, Al doped and Al coated NiO layers for gas detection with HSGFET

Cited by 21 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. The correlation between surface scaling behavior and optical properties of NiO thin films nanostructures: An investigation based on fractal concepts;Ceramics International;2024-08

2. Harnessing the power of water: A review of hydroelectric nanogenerators;Nano Energy;2023-11

3. In-depth opto-electrical analysis of Ni:CdS film towards the performance as Ag/Ni:CdS/FTO Schottky diode;Optical Materials;2023-09

4. On the Quantum Confinement Effects in Ultrathin PdO Films by Experiment and Theory;Materials;2022-12-06

5. Recent Development of Moisture‐Enabled‐Electric Nanogenerators;Small;2022-09-22

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3