A Comprehensive Performance Analysis of a 48-Watt Transformerless DC-DC Boost Converter Using a Proportional–Integral–Derivative Controller with Special Attention to Inductor Design and Components Reliability

Author:

Jayaswal Kuldeep1ORCID,Palwalia D. K.1ORCID,Guerrero Josep M.234ORCID

Affiliation:

1. Department of Electrical Engineering, Rajasthan Technical University, Kota 324010, India

2. Center for Research on Microgrids at UPC (UPC CROM), Department of Electronic Engineering, Technical University of Catalonia (UPC), 08019 Barcelona, Spain

3. Catalan Institution for Research and Advanced Studies (ICREA), Pg. Lluís Companys 23, 08010 Barcelona, Spain

4. Center for Research on Microgrids (CROM), AAU Energy, Aalborg University, 9220 Aalborg, Denmark

Abstract

In this research paper, a comprehensive performance analysis was carried out for a 48-watt transformerless DC-DC boost converter using a Proportional–Integral–Derivative (PID) controller through dynamic modeling. In a boost converter, the optimal design of the magnetic element plays an important role in efficient energy transfer. This research paper emphasizes the design of an inductor using the Area Product Technique (APT) to analyze factors such as area product, window area, number of turns, and wire size. Observations were made by examining its response to changes in load current, supply voltage, and load resistance at frequency levels of 100 and 500 kHz. Moreover, this paper extended its investigation by analyzing the failure rates and reliability of active and passive components in a 48-watt boost converter, providing valuable insights about failure behavior and reliability. Frequency domain analysis was conducted to assess the controller’s stability and robustness. The results conclusively underscore the benefits of incorporating the designed PID controller in terms of achieving the desired regulation and rapid response to disturbances at 100 and 500 kHz. The findings emphasize the outstanding reliability of the inductor, evident from the significantly low failure rates in comparison to other circuit components. Conversely, the research also reveals the inherent vulnerability of the switching device (MOSFET), characterized by a higher failure rate and lower reliability. The MATLAB® Simulink platform was utilized to investigate the results.

Funder

This research is funded by VILLUM FONDEN through the VILLUM Investigator Grant, Center for Research on Micro-grids (CROM).

Publisher

MDPI AG

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