Degradation Characteristics and Reliability Assessment of 1310 nm VCSEL for Microwave Photonic Link

Abstract

The long-term reliability of the commercially available vertical-cavity surface-emitting laser (VCSEL) at 1310 nm wavelength is investigated. To do so, a high current accelerated life test is used to evaluate the 1310 nm VCSEL reliability. Variations of properties that depend on the operating condition are characterized by the light-current-voltage, leakage current and low-frequency noise. When the aging current is 6 mA, 8 mA and 10 mA, the maximum output power reduces by 5%, 6% and 15% of the initial value, respectively. It is demonstrated theoretically and experimentally that the leakage current increases and reverse bias breakdown voltage decreases after the accelerated current aging test. The current noise power spectral density increases after the device ages, and the noise increases with the augment of the electrical stress. When the bias current of VCSEL is below the threshold, the frequency index factor and noise amplitude gradually increase with the bias current increase. Further, lifetime fitting curves of the devices at an accelerating current of 6 mA, 8 mA and 10 mA are obtained, and the median lifetime of 67 years at the operating current is extrapolated.