Effect of X-rays Irradiation on the Reliability of 850nm High-speed VCSEL-Reference-Cited by-同舟云学术

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Effect of X-rays Irradiation on the Reliability of 850nm High-speed VCSEL

Published:2023-08-08 Issue: Volume: Page:1-6
ISSN:
Container-title:2023 24th International Conference on Electronic Packaging Technology (ICEPT)
language:
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Author:

Zhang Jide¹,Liao Wenyuan²,Yang Shaohua²,Lu Guoguang²,Wang Xiaohua¹,Wei Zhipeng¹

Affiliation:

1. Changchun University of Science and Technology,College of Physics,Changchun,China

2. The Fifth Electronic Research Institute of the Ministry of Industry and Information Technology,Science and Technology on Reliability Physics and Application of Electronic Component Laboratory,Guangzhou,China

Funder

National Natural Science Foundation of China

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10491594/10491891/10492213.pdf?arnumber=10492213

Reference24 articles.

1. Assessing the impact of the space radiation environment on parametric degradation and single-event transients in optocouplers

2. Non-destructive testing and process control using X-ray methods and radioisotopes;Kröning

3. Space radiation effects in high performance fiber optic data links for satellite data management

4. Total ionizing dose effects in MOS oxides and devices

5. Damage correlations in semiconductors exposed to gamma, electron and proton radiations

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