H-Terminated Diamond MOSFETs on High-Quality Diamond Film Grown by MPCVD

Author:

Hu Wenxiao1,Yu Xinxin12,Tao Tao1ORCID,Chen Kai1,Ye Yucong1,Zhou Jianjun3,Xie Zili1,Yan Yu1,Liu Bin1ORCID,Zhang Rong1ORCID

Affiliation:

1. Jiangsu Provincial Key Laboratory of Advanced Photonic and Electronic Materials, School of Electronic Science and Engineering, Nanjing University, Nanjing 210093, China

2. CETC Key Laboratory of Carbon-Based Electronics, Nanjing Electronic Devices Institute, Nanjing 210016, China

3. National Key Lab of Solid-State Microwave Devices and Circuits, Nanjing Electronic Devices Institute, Nanjing 210016, China

Abstract

Diamond-based transistors have been considered as one of the best choices due to the numerous advantages of diamond. However, difficulty in the growth and fabrication of diamond needs to be addressed. In this paper, high quality diamond film with an atomically flat surface was grown by microwave plasma chemical vapor deposition. High growth rate, as much as 7 μm/h, has been acquired without nitrogen doping, and the root mean square (RMS) of the surface roughness was reduced from 0.92 nm to 0.18 nm by using a pre-etched process. H-terminated diamond MOSFETs were fabricated on a high-quality epitaxial diamond layer, of which the saturated current density was enhanced. The hysteresis of the transfer curve and the shift of the threshold voltage were significantly reduced as well.

Funder

National Key R&D Program of China

National Nature Science Foundation of China

Leading-edge Technology Program of Jiangsu Natural Science Foundation

Fundamental Research Foundation for the Central Universities

Publisher

MDPI AG

Subject

Inorganic Chemistry,Condensed Matter Physics,General Materials Science,General Chemical Engineering

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