Periodic Artifacts Generation and Suppression in X-ray Ptychography

Author:

Liu Shilei123,Xu Zijian124ORCID,Xing Zhenjiang5,Zhang Xiangzhi12,Li Ruoru123,Qin Zeping124,Wang Yong12,Tai Renzhong124

Affiliation:

1. Shanghai Synchrotron Radiation Facility, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201204, China

2. Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China

3. School of Physical Science and Technology, Shanghai Tech University, Shanghai 201210, China

4. University of Chinese Academy of Sciences, Beijing 100049, China

5. Shenzhen Institute of Advanced Science Facilities, Shenzhen 518107, China

Abstract

As a unique coherent diffraction imaging method, X-ray ptychography has an ultrahigh resolution of several nanometers for extended samples. However, ptychography is often degraded by various noises that are mixed with diffracted signals on the detector. Some of the noises can transform into periodic artifacts (PAs) in reconstructed images, which is a basic problem in raster-scan ptychography. Herein, we propose a novel periodic-artifact suppressing algorithm (PASA) and present a new understanding of PAs or raster-grid pathology generation mechanisms, which include static intensity (SI) as an important cause of PAs. The PASA employs a gradient descent scheme to iteratively separate the SI pattern from original datasets and a probe support constraint applied in the object update. Both simulative and experimental data reconstructions demonstrated the effectiveness of the new algorithm in suppressing PAs and improving ptychography resolution and indicated a better performance of the PASA method in PA removal compared to other mainstream algorithms. In the meantime, we provided a complete description of SI conception and its key role in PA generation. The present work enhances the feasibility of raster-scan ptychography and could inspire new thoughts for dealing with various noises in ptychography.

Funder

Ministry of Science and Technology of the People’s Republic of China

National Natural Science Foundation of China

Science and Technology Commission of Shanghai Municipality

Publisher

MDPI AG

Subject

Radiology, Nuclear Medicine and imaging,Instrumentation,Atomic and Molecular Physics, and Optics

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