Advanced denoising for X-ray ptychography-Reference-Cited by-同舟云学术

Advanced denoising for X-ray ptychography

Published:2019-04-01 Issue:8 Volume:27 Page:10395
ISSN:1094-4087
Container-title:Optics Express
language:en
Short-container-title:Opt. Express

Author:

Chang Huibin^ORCID,Enfedaque Pablo,Zhang Jie,Reinhardt Juliane,Enders Bjoern,Yu Young-Sang,Shapiro David,Schroer Christian G.,Zeng Tieyong,Marchesini Stefano^ORCID

Funder

Bundesministerium für Bildung und Forschung

Chinese University of Hong Kong

Helmholtz Association

National Natural Science Foundation of China

National Science Foundation

Natural Science Foundation of Tianjin City

Office of Science

Research Grants Council, University Grants Committee

Tianjin Normal University

Tianjin Young Backbone of Innovative Personnel Training Program and Program for Innovative Research Team in Universities of Tianjin

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference35 articles.

1. Resolution beyond the 'information limit' in transmission electron microscopy

2. A phase retrieval algorithm for shifting illumination

3. An improved ptychographical phase retrieval algorithm for diffractive imaging

4. Electron ptychography of 2D materials to deep sub-ångström resolution

5. Soft x-ray ptychography studies of nanoscale magnetic and structural correlations in thin SmCo5 films

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