The Physics behind the Modulation of Thermionic Current in Photodetectors Based on Graphene Embedded between Amorphous and Crystalline Silicon

Author:

Crisci Teresa12ORCID,Maccagnani Piera34ORCID,Moretti Luigi2,Summonte Caterina3ORCID,Gioffrè Mariano1ORCID,Rizzoli Rita3ORCID,Casalino Maurizio1ORCID

Affiliation:

1. Institute of Applied Science and Intelligent Systems “Eduardo Caianiello” (CNR), 80131 Napoli, Italy

2. Department of Mathematics and Physics, University of Campania “Luigi Vanvitelli”, 81100 Caserta, Italy

3. Institute for Microelectronics and Microsystems (CNR), 40129 Bologna, Italy

4. Department of Physics and Earth Sciences, University of Ferrara, Via Giuseppe Saragat 1/c, 44122 Ferrara, Italy

Abstract

In this work, we investigate a vertically illuminated near-infrared photodetector based on a graphene layer physically embedded between a crystalline and a hydrogenated silicon layer. Under near-infrared illumination, our devices show an unforeseen increase in the thermionic current. This effect has been ascribed to the lowering of the graphene/crystalline silicon Schottky barrier as the result of an upward shift in the graphene Fermi level induced by the charge carriers released from traps localized at the graphene/amorphous silicon interface under illumination. A complex model reproducing the experimental observations has been presented and discussed. Responsivity of our devices exhibits a maximum value of 27 mA/W at 1543 nm under an optical power of 8.7 μW, which could be further improved at lower optical power. Our findings offer new insights, highlighting at the same time a new detection mechanism which could be exploited for developing near-infrared silicon photodetectors suitable for power monitoring applications.

Funder

IMM Institute

Publisher

MDPI AG

Subject

General Materials Science,General Chemical Engineering

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