Analysis of Transient Degradation Behaviors of Organic Light-Emitting Diodes under Electrical Stress

Author:

Lee Gyeong Won,Choi Yoonsuk,Kim Heejin,Park Jongwoo,Shim Jong-In,Shin Dong-SooORCID

Abstract

Despite the wide application of organic light-emitting diodes (OLEDs), the performance of OLED devices is sometimes limited by their reliabilities. In this paper, we report the transient degradation behaviors of fluorescent blue OLEDs, where both the current and luminance initially increase under electrical stress within a short stress time. We analyze the degradation mechanism in terms of the carrier recombination and transport. From the comprehensive analyses of electrical and optical characteristics, it is suggested that the electron transport is responsible for the initial transient behavior of the device.

Publisher

MDPI AG

Subject

Fluid Flow and Transfer Processes,Computer Science Applications,Process Chemistry and Technology,General Engineering,Instrumentation,General Materials Science

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