Point Cloud Scene Completion of Obstructed Building Facades with Generative Adversarial Inpainting

Author:

Chen JingdaoORCID,Yi John Seon KeunORCID,Kahoush Mark,Cho Erin S.,Cho Yong K.ORCID

Abstract

Collecting 3D point cloud data of buildings is important for many applications such as urban mapping, renovation, preservation, and energy simulation. However, laser-scanned point clouds are often difficult to analyze, visualize, and interpret due to incompletely scanned building facades caused by numerous sources of defects such as noise, occlusions, and moving objects. Several point cloud scene completion algorithms have been proposed in the literature, but they have been mostly applied to individual objects or small-scale indoor environments and not on large-scale scans of building facades. This paper introduces a method of performing point cloud scene completion of building facades using orthographic projection and generative adversarial inpainting methods. The point cloud is first converted into the 2D structured representation of depth and color images using an orthographic projection approach. Then, a data-driven 2D inpainting approach is used to predict the complete version of the scene, given the incomplete scene in the image domain. The 2D inpainting process is fully automated and uses a customized generative-adversarial network based on Pix2Pix that is trainable end-to-end. The inpainted 2D image is finally converted back into a 3D point cloud using depth remapping. The proposed method is compared against several baseline methods, including geometric methods such as Poisson reconstruction and hole-filling, as well as learning-based methods such as the point completion network (PCN) and TopNet. Performance evaluation is carried out based on the task of reconstructing real-world building facades from partial laser-scanned point clouds. Experimental results using the performance metrics of voxel precision, voxel recall, position error, and color error showed that the proposed method has the best performance overall.

Publisher

MDPI AG

Subject

Electrical and Electronic Engineering,Biochemistry,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

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