Affiliation:
1. School of Civil, Architectural Engineering and Landscape Architecture, Sungkyunkwan University, Suwon 16419, Republic of Korea
2. Smart Convergence Research Department, Power Technology Research Institute, KEPCO E & C, Gimcheon 39660, Republic of Korea
Abstract
Existing deep learning (DL) models can detect wider or thicker segments of cracks that occupy multiple pixels in the width direction, but fail to distinguish the thin tail shallow segment or propagating crack occupying fewer pixels. Therefore, in this study, we proposed a scheme for tracking missing thin/propagating crack segments during DL-based crack identification on concrete surfaces in a computationally efficient manner. The proposed scheme employs image processing as a preprocessor and a postprocessor for a 1D DL model. Image-processing-assisted DL as a precursor to DL eliminates labor-intensive labeling and the plane structural background without any distinguishable features during DL training and testing; the model identifies potential crack candidate regions. Iterative differential sliding-window-based local image processing as a postprocessor to DL tracks missing thin cracks on segments classified as cracks. The capability of the proposed method is demonstrated on low-resolution images with cracks of single-pixel width, captured using unmanned aerial vehicles on concrete structures with different surface textures, different scenes with complicated disturbances, and optical variability. Due to the multi-threshold-based image processing, the overall approach is invariant to the choice of initial sensitivity parameters, hyperparameters, and the sequence of neuron arrangement. Further, this technique is a computationally efficient alternative to semantic segmentation that results in pixelated mapping/classification of thin crack regimes, which requires labor-intensive and skilled labeling.
Funder
Ministry of Trade, Industry and Energy (MOTIE) and the Korea Institute for Advancement of Technology
Subject
Electrical and Electronic Engineering,Biochemistry,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry
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