Automatic Thinning Detection through Image Segmentation Using Equivalent Array-Type Lamp-Based Lock-in Thermography

Author:

Lee Seungju1ORCID,Chung Yoonjae2,Kim Chunyoung3ORCID,Kim Wontae1ORCID

Affiliation:

1. Department of Future Convergence Engineering, Kongju National University, 1223-24 Cheonan-Daero, Seobuk-gu, Cheonan-si 31080, Republic of Korea

2. Eco-Sustainable Energy Research Institute, Kongju National University, 1223-24 Cheonan-Daero, Seobuk-gu, Cheonan-si 31080, Republic of Korea

3. enesG, 8, Techno 10-ro, Yuseong-gu, Daejeon 34026, Republic of Korea

Abstract

Among the non-destructive testing (NDT) techniques, infrared thermography (IRT) is an attractive and highly reliable technology that can measure the thermal response of a wide area in real-time. In this study, thinning defects in S275 specimens were detected using lock-in thermography (LIT). After acquiring phase and amplitude images using four-point signal processing, the optimal excitation frequency was calculated. After segmentation was performed on each defect area, binarization was performed using the Otsu algorithm. For automated detection, the boundary tracking algorithm was used. The number of pixels was calculated and the detectability using RMSE was evaluated. Clarification of defective objects using image segmentation detectability evaluation technique using RMSE was presented.

Funder

National Research Foundation of Korea

Ministry of SMEs and Startups

Publisher

MDPI AG

Subject

Electrical and Electronic Engineering,Biochemistry,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3