YOLO-MBBi: PCB Surface Defect Detection Method Based on Enhanced YOLOv5

Author:

Du Bowei1ORCID,Wan Fang1,Lei Guangbo1,Xu Li1,Xu Chengzhi1,Xiong Ying1

Affiliation:

1. School of Computer Science, Hubei University of Technology, Wuhan 430068, China

Abstract

Printed circuit boards (PCBs) are extensively used to assemble electronic equipment. Currently, PCBs are an integral part of almost all electronic products. However, various surface defects can still occur during mass production. An enhanced YOLOv5s network named YOLO-MBBi is proposed to detect surface defects on PCBs to address the shortcomings of the existing PCB surface defect detection methods, such as their low accuracy and poor real-time performance. YOLO-MBBi uses MBConv (mobile inverted residual bottleneck block) modules, CBAM attention, BiFPN, and depth-wise convolutions to substitute layers in the YOLOv5s network and replace the CIoU loss function with the SIoU loss function during training. Two publicly available datasets were selected for this experiment. The experimental results showed that the mAP50 and recall values of YOLO-MBBi were 95.3% and 94.6%, which were 3.6% and 2.6% higher than those of YOLOv5s, respectively, and the FLOPs were 12.8, which was much smaller than YOLOv7’s 103.2. The FPS value reached 48.9. Additionally, after using another dataset, the YOLO-MBBi metrics also achieved satisfactory accuracy and met the needs of industrial production.

Funder

Science and Technology Research Project of the Education Department of Hubei Province

Publisher

MDPI AG

Subject

Electrical and Electronic Engineering,Computer Networks and Communications,Hardware and Architecture,Signal Processing,Control and Systems Engineering

Reference32 articles.

1. A Review of Various Defects in PCB;Sankar;J. Electron. Test.,2022

2. Houdek, C., and Design, C. (2016). Inspection and Testing Methods for PCBs: An Overview, Engineer/OwnerCaltronics Design & Assembly.

3. Text recognition in pcbs: An object character recognition (ocr) algorithm;Iano;Int. J. Dev. Res.,2020

4. A review and analysis of automatic optical inspection and quality monitoring methods in electronics industry;Mousavi;IEEE Access,2020

5. Kumar, M., Singh, N.K., Kumar, M., and kumar Vishwakarma, A. (2015, January 15–16). A novel approach of standard data base generation for defect detection in bare PCB. Proceedings of the International Conference on Computing, Communication & Automation, Greater Noida, India.

Cited by 21 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3