Radiation Qualification by Means of the System-Level Testing: Opportunities and Limitations-Reference-Cited by-同舟云学术

Radiation Qualification by Means of the System-Level Testing: Opportunities and Limitations

Published:2022-01-27 Issue:3 Volume:11 Page:378
ISSN:2079-9292
Container-title:Electronics
language:en
Short-container-title:Electronics

Author:

Rajkowski Tomasz^ORCID,Saigné Frédéric,Wang Pierre-Xiao

Abstract

System-level radiation testing of electronics is evaluated, based on test examples of the System-in-Package (SiP) module irradiations. Total ionizing dose and single event effects tests are analyzed to better understand the opportunities and limitations of the system-level approach in the context of the radiation qualification of electronics. Impact on the SiP product development is discussed.

Funder

European Union

Occitanie Region and the EU via ERDF funds

Publisher

MDPI AG

Subject

Electrical and Electronic Engineering,Computer Networks and Communications,Hardware and Architecture,Signal Processing,Control and Systems Engineering

Link

https://www.mdpi.com/2079-9292/11/3/378/pdf

Reference31 articles.

1. Radiation Hardness Assurance Through System-Level Testing: Risk Acceptance, Facility Requirements, Test Methodology, and Data Exploitation

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