Variability and Reliability of Single-Walled Carbon Nanotube Field Effect Transistors
Author:
Publisher
MDPI AG
Subject
Electrical and Electronic Engineering,Computer Networks and Communications,Hardware and Architecture,Signal Processing,Control and Systems Engineering
Link
http://www.mdpi.com/2079-9292/2/4/332/pdf
Reference160 articles.
1. Helical microtubules of graphitic carbon
2. Quantum Transport: Atom to Transistor;Datta,2005
3. Cutting lines near the Fermi energy of single-wall carbon nanotubes
4. Characterizing carbon nanotube samples with resonance Raman scattering
5. Band Structure, Phonon Scattering, and the Performance Limit of Single-Walled Carbon Nanotube Transistors
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