SKG-Lock+: A Provably Secure Logic Locking SchemeCreating Significant Output Corruption

Author:

Nguyen Quang-Linh,Dupuis SophieORCID,Flottes Marie-LiseORCID,Rouzeyre Bruno

Abstract

The current trend to globalize the supply chain in the Integrated Circuits (ICs) industry has raised several security concerns including, among others, IC overproduction. Over the past years, logic locking has grown into a prominent countermeasure to tackle this threat in particular. Logic locking consists of “locking” an IC with an added primary input, the so-called key, which, unless fed with the correct secret value, renders the ICs unusable. One of the first criteria ensuring the quality of a logic locking technique was the output corruption, i.e., the corruption at the outputs of a locked circuit, for any wrong key value. However, since the introduction of SAT-based attacks, resulting countermeasures have compromised this criterion in favor of a better resilience against such attacks. In this work, we propose SKG-Lock+, a Provably Secure Logic Locking scheme that can thwart SAT-based attacks while maintaining significant output corruption. We perform a comprehensive security analysis of SKG-Lock+ and show its resilience against SAT-based attacks, as well as various other state-of-the-art attacks. Compared with related works, SKG-Lock+ provides higher output corruption and incurs acceptable overhead.

Funder

French National Research Agency

Publisher

MDPI AG

Subject

Electrical and Electronic Engineering,Computer Networks and Communications,Hardware and Architecture,Signal Processing,Control and Systems Engineering

Reference67 articles.

1. Simply Fabless!;Kumar;IEEE-Solid-State Circuits Mag.,2011

2. Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain;Guin;Proc. IEEE,2014

3. Regaining Trust in VLSI Design: Design-for-Trust Techniques;Rajendran;Proc. IEEE,2014

4. Keynote: A Disquisition on Logic Locking;Chakraborty;IEEE Trans. -Comput.-Aided Des. Integr. Circuits Syst. (TCAD),2019

5. Logic Locking: A Survey of Proposed Methods and Evaluation Metrics;Dupuis;J. Electron. Test. Theory Appl. (JETTA),2019

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3