Special Issue on “Advanced Technology Related to Radar Signal, Imaging, and Radar Cross-Section Measurement”-Reference-Cited by-同舟云学术

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Special Issue on “Advanced Technology Related to Radar Signal, Imaging, and Radar Cross-Section Measurement”

Published:2020-04-16 Issue:4 Volume:9 Page:653
ISSN:2079-9292
Container-title:Electronics
language:en
Short-container-title:Electronics

Author:

Kobayashi Hirokazu,Moriyama Toshifumi

Abstract

A radar system is made of many elemental and hard/software technologies [...]

Publisher

MDPI AG

Subject

Electrical and Electronic Engineering,Computer Networks and Communications,Hardware and Architecture,Signal Processing,Control and Systems Engineering

Link

https://www.mdpi.com/2079-9292/9/4/653/pdf

Reference33 articles.

1. Electronics Special Issues Advanced Technology Related to Radar Signal, Imaging, and Radar Cross-Sectionhttps://www.mdpi.com/journal/electronics/special_issues/radar_related

2. An Inverse Synthetic Aperture Ladar Imaging Algorithm of Maneuvering Target Based on Integral Cubic Phase Function-Fractional Fourier Transform

3. A Synthetic Aperture Radar (SAR)-Based Technique for Microwave Imaging and Material Characterization

4. Retrieval of Three-Dimensional Surface Deformation Using an Improved Differential SAR Tomography System

5. Narrowband Interference Separation for Synthetic Aperture Radar via Sensing Matrix Optimization-Based Block Sparse Bayesian Learning

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