Low-Power Very-Large-Scale Integration Implementation of Fault-Tolerant Parallel Real Fast Fourier Transform Architectures Using Error Correction Codes and Algorithm-Based Fault-Tolerant Techniques

Author:

Chowdary M. Kalpana1,Turaka Rajasekhar2ORCID,Alabduallah Bayan3,Khan Mudassir4ORCID,Babu J. Chinna5ORCID,Kiran Ajmeera1

Affiliation:

1. Department of Computer Science and Engineering, MLR Institute of Technology, Hyderabad 500043, Telangana, India

2. Department of Electronics and Communication Engineering, Nalla Narasimha Reddy Education Society’s Group of Institutions, Hyderabad 500088, Telangana, India

3. Department of Information Systems, College of Computer and Information Sciences, Princess Nourah Bint Abdulrahman University, P.O. Box 84428, Riyadh 11671, Saudi Arabia

4. Department of Computer Science, College of Science & Arts, Tanumah, King Khalid University, P.O. Box 960, Abha 61421, Saudi Arabia

5. Department of Electronics and Communication Engineering, Annamacharya Institute of Technology and Sciences, Rajampet 516126, Andhra Pradesh, India

Abstract

As technology advances, electronic circuits are more vulnerable to errors. Soft errors are one among them that causes the degradation of a circuit’s reliability. In many applications, protecting critical modules is of main concern. One such module is Fast Fourier Transform (FFT). Real FFT (RFFT) is a memory-based FFT architecture. RFFT architecture can be optimized by its processing element through employing several types of adder and multipliers and an optimized memory usage. It has been seen that various blocks operate simultaneously in many applications. For the protection of parallel FFTs using conventional Error Correction Codes (ECCs), algorithmic-based fault tolerance (ABFT) techniques like Parseval checks and its combination are seen. In this brief, the protection schemes are applied to the single RAM-based parallel RFFTs and dual RAM-based parallel RFFTs. This work is implemented on platforms such as field programmable gate arrays (FPGAs) using Verilog HDL and on application-specific integrated circuit (ASIC) using a cadence encounter digital IC implementation tool. The synthesis results, including LUTs, slices registers, LUT–Flip-Flop pairs, and the frequency of two types of protected parallel RFFTs, are analyzed, along with the existing FFTs. The two proposed architectures with the combined protection scheme Parity-SOS-ECC present an 88% and 33% reduction in area overhead when compared to the existing parallel RFFTs. The performance metrics like area, power, delay, and power delay product (PDP) in an ASIC of 45 nm and 90 nm technology are evaluated, and the proposed single RAM-based parallel RFFTs architecture presents a 62.93% and 57.56% improvement of PDP in 45 nm technology and a 67.20% and 60.31% improvement of PDP in 90 nm technology compared to the dual RAM-based parallel RFFTs and the existing architecture, respectively.

Funder

Princess Nourah bint Abdulrahman University Researchers Supporting Project

Publisher

MDPI AG

Subject

Process Chemistry and Technology,Chemical Engineering (miscellaneous),Bioengineering

Reference25 articles.

1. Soft errors in advanced computer systems;Baumann;IEEE Des. Test Comput.,2005

2. (2008, August 14). International Technology Roadmap for Semiconductors. Available online: http://www.itrs.net/Links/2008ITRS/Home2008.html.

3. Ko, Y. (2021). Characterizing System-Level Masking Effects against Soft Errors. Electronics, 10.

4. Algorithm-based fault tolerance: A review;Vijay;Microprocess. Microsyst.,1997

5. Algorithm-based fault detection for signal processing applications;Reddy;IEEE Trans. Comput.,1990

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