Abstract
Zinc oxide (ZnO) nanogenerators have attracted increasing interest in the scientific community for use in energy harvesting and mechanical sensing applications. Understanding the interplay between piezoelectricity and semiconductor physics is fundamental to enhancing these devices’ performances, although direct characterization at the nanoscale is challenging. With this work, we present a new strategy to improve piezoresponse force microscopy (PFM) measurements and analysis. This strategy was applied to study the piezoelectric performances of ZnO nanowires grown on seed layers deposited by gravure printing onto flexible substrates. We demonstrate the influence of nanowire diameter and atomic force microscope (AFM) tip position on the piezoresponse amplitude. We also explain our results with simulations showing the importance of considering semiconducting properties in the analysis.
Cited by
7 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献