Techniques for the Investigation of Segmented Sensors Using the Two Photon Absorption-Transient Current Technique-Reference-Cited by-同舟云学术

Techniques for the Investigation of Segmented Sensors Using the Two Photon Absorption-Transient Current Technique

Published:2023-01-14 Issue:2 Volume:23 Page:962
ISSN:1424-8220
Container-title:Sensors
language:en
Short-container-title:Sensors

Author:

Pape Sebastian^ORCID,Currás Esteban^ORCID,Fernández García Marcos^ORCID,Moll Michael^ORCID

Abstract

The two photon absorption-transient current technique (TPA-TCT) was used to investigate a silicon strip detector with illumination from the top. Measurement and analysis techniques for the TPA-TCT of segmented devices are presented and discussed using a passive strip CMOS detector and a standard strip detector as an example. The influence of laser beam clipping and reflection is shown, and a method that allows to compensate these intensity-related effects for investigation of the electric field is introduced and successfully employed. Additionally, the mirror technique is introduced, which exploits reflection at a metallised back side to enable the measurement directly below a top metallisation while illuminating from the top.

Funder

European Union’s Horizon 2020 Research and Innovation programme

Wolfgang Gentner Program of the German Federal Ministry of Education and Research

CERN Knowledge Transfer Fund

Publisher

MDPI AG

Subject

Electrical and Electronic Engineering,Biochemistry,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

Link

https://www.mdpi.com/1424-8220/23/2/962/pdf

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