Annealing of silver nanolayers sputtered on polytetrafluoroethylene-Reference-Cited by-同舟云学术

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Annealing of silver nanolayers sputtered on polytetrafluoroethylene

Published:2013-01-31 Issue:6 Volume:45 Page:1063-1066
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Siegel J.¹,Juřík P.¹,Kolská Z.²,Švorčík V.¹

Affiliation:

1. Department of Solid State Engineering; Institute of Chemical Technology; 166 28 Prague Czech Republic

2. Faculty of Science; J.E. Purkyně University; Usti nad Labem Czech Republic

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/sia.5227/fullpdf

Reference19 articles.

1. Electromigration testing of integrated circuit interconnections

2. The electromigration failure distribution: The fine‐line case

3. Measurement of the electrical properties of electromigration specimens

4. Noise and fluctuations in submicrometric Al-Si interconnect lines

5. Scaling and Universality in Electrical Failure of Thin Films

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