Zinc Oxide Defect Microstructure and Surface Chemistry Derived from Oxidation of Metallic Zinc: Thin‐Film Transistor and Sensor Behavior of ZnO Films and Rods-Reference-Cited by-同舟云学术

Zinc Oxide Defect Microstructure and Surface Chemistry Derived from Oxidation of Metallic Zinc: Thin‐Film Transistor and Sensor Behavior of ZnO Films and Rods

Published:2021-01-22 Issue:17 Volume:27 Page:5422-5431
ISSN:0947-6539
Container-title:Chemistry – A European Journal
language:en
Short-container-title:Chem. Eur. J.

Author:

Hoffmann Rudolf C.¹,Sanctis Shawn¹,Liedke Maciej O.²,Butterling Maik²,Wagner Andreas²,Njel Christian³,Schneider Jörg J.¹^ORCID

Affiliation:

1. Eduard-Zintl-Institute for Inorganic and Physical Chemistry Technical University Darmstadt Alarich-Weiss-Straße 12 64287 Darmstadt Germany

2. Institute of Radiation Physics Helmholtz-Zentrum Dresden-Rossendorf Bautzner Landstraße 400 01328 Dresden Germany

3. Institute for Applied Materials—Energy Storage Karlsruhe Institute of Technology (KIT) Hermann-von-Helmholtz-Platz 1 76344 Eggenstein- Leopoldshafen Germany

Funder

Deutsche Forschungsgemeinschaft

Publisher

Wiley

Subject

General Chemistry,Catalysis,Organic Chemistry

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/chem.202004270

Reference69 articles.

1. UV-LED Photo-activated Chemical Gas Sensors: A Review

2. Perspective of zinc oxide based thin film transistors: a comprehensive review

3. ZnO-based photodetector: from photon detector to pyro-phototronic effect enhanced detector