Author:
Butterworth J. A.,Pao L. Y.,Abramovitch D. Y.
Subject
Control and Systems Engineering
Reference16 articles.
1. Butterworth, J. A., L. Y. Pao, and D. Y. Abramovitch, “Architectures for tracking control in atomic force microscopes,” Proc. IFAC World Cong., Seoul, Korea, pp. 8236-8250 (2008).
2. Vibration compensation for high speed scanning tunneling microscopy;Croft;Rev. Sci. Instr.,1999
3. Creep, hysteresis, and vibration compensation for piezoactuators: atomic force microscopy application;Croft;ASME J. Dyn. Sys., Meas., & Control,2001
4. Fast contact-mode atomic force microscopy on biological specimen by model-based control;Schitter;Ultramicroscopy,2004
5. Identification and open-loop tracking control of a piezoelectric tube scanner for high-speed scanning-probe microscopy;Schitter G.;IEEE Trans. Control. Syst. Technol.,2004
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