Brillouin scattering determination of the elastic constants in supported Ge films-Reference-Cited by-同舟云学术

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Brillouin scattering determination of the elastic constants in supported Ge films

Published:1993-12-16 Issue:2 Volume:140 Page:429-437
ISSN:0031-8965
Container-title:Physica Status Solidi (a)
language:de
Short-container-title:Phys. Stat. Sol. (a)

Author:

Xia Hua,Zhang Wei,Qu X. X.,Zhang Jun,Jiang J. G.,Zhang Rong

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference14 articles.

1. High efficiency a-Si solar cells with a superlattice structure p-layer and stable a-Si solar cells with reduced SiH2 bond density

2. Amorphous silicon superlattice thin film transistors

3. Indirect band gap of coherently strainedGexSi1−xbulk alloys on〈001〉silicon substrates

4. Raman spectroscopy studies of progressively annealed amorphous Si/Ge superlattices

5. Thermally induced structural change ofa‐Ge:H/a‐GeNxmultilayer structures

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Combined surface Brillouin scattering and x-ray reflectivity characterization of thin metallic films;Journal of Applied Physics;1997-01-15

2. Impulsive stimulated thermal scattering for sub-micron-thickness film characterization;Thin Solid Films;1996-12

3. Surface phonon spectroscopy with frequency-domain impulsive stimulated light scattering;Solid State Communications;1996-12

4. Determination of elastic constants of thin films from phase velocity dispersion of different surface acoustic wave modes;Journal of Applied Physics;1995-10-15

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