Capacitance measurements of the silicon—silicon dioxide—potassium chloride water solution interface as a method to determine the fixed charge value and its centroid-Reference-Cited by-同舟云学术

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Capacitance measurements of the silicon—silicon dioxide—potassium chloride water solution interface as a method to determine the fixed charge value and its centroid

Published:1978-07-16 Issue:1 Volume:48 Page:203-208
ISSN:0031-8965
Container-title:Physica Status Solidi (a)
language:en
Short-container-title:Phys. Stat. Sol. (a)

Author:

Wolkenberg A.

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference13 articles.

1. Semiconductor Electrode Reactions, in: Recent Advances in Electrochemistry, Ed. Intersci. Publ., New York 1961.

2. Carrier Concentration Measurements, in: Gallium Arsenide by Electrochemical Methods, IET Reports VIII, Warsaw 1975 (p. 11).

3. Measurement of physical properties of gallium arsenide and silicon by electrochemical methods

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Mechanism for the Effect of Doping on the Silicon Native Oxide Thickness;Physica Status Solidi (a);1983-09-16

2. Electrochemical investigation of SiO2Si equivalent charges;Solid-State Electronics;1981-01

3. Properties of boron implanted silicon dioxide;Applications of Surface Science;1979-07

4. Energetic barrier height hypothesis on the silicon-electrolyte and gallium arsenide-electrolyte interfaces;Physica Status Solidi (a);1978-11-16

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