Lifetime control in silicon through impact sound stressing-Reference-Cited by-同舟云学术

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Lifetime control in silicon through impact sound stressing

Published:1977-08-16 Issue:2 Volume:42 Page:553-564
ISSN:0031-8965
Container-title:Physica Status Solidi (a)
language:en
Short-container-title:Phys. Stat. Sol. (a)

Author:

Schwuttke G. H.,Yang K.,Kappert H.

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference6 articles.

1. Electrochem.;Spenke,1969

2. , and , in: Adv. Proj. Res. Agency, Washington D. C, Tech. Rep. No. 7, Chap. 2, Contract No. DAHC. 15-72-C-0274 Jan. 1976 (p. 48).

3. Electrochem.;Lawrence,1973

4. Effect of Growth Rate on Stacking‐Fault Density in Epitaxial Silicon Layers

5. Dislocations and Plastic Flow in Crystals, Clarendon Press, Oxford 1953.

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