Synchrotron X-ray topography study of stresses appearing to crystal boundaries during the aluminium recrystallization process
Author:
Publisher
Wiley
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference20 articles.
1. Pendellösung Fringes in Distorted Crystals II. Application to Two-Beam Cases
2. Contraction of Pendellösung Fringes in Distorted Crystals
3. OBSERVATIONS OF PENDELLÖSUNG FRINGES IN ELASTICALLY DEFORMED CRYSTALS
4. X-ray diffraction topographs of an elastically distorted crystal
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Synchrotron X-radiation topography;Materials Science Reports;1992-07
2. Insight into the genesis of irregularity during crystal growth achieved monochromatic high sensitivity monochromatic synchrotron x-radiation diffraction imaging (topography);Progress in Crystal Growth and Characterization of Materials;1990-01
3. In situsynchrotron X-ray topography study of the generation of lattice dislocations in aluminium by migrating grain boundaries;Philosophical Magazine A;1988-06
4. Measurement of Grain Boundary Migration In Situ by Synchrotron X-Ray Topography;MRS Proceedings;1988-01
5. Investigation of Grain Boundary Migration in Situ by Synchrotron X-Ray Topography;MRS Proceedings;1988
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