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Synchrotron X-radiation topography

Published:1992-07 Issue:8 Volume:8 Page:371-407
ISSN:0920-2307
Container-title:Materials Science Reports
language:en
Short-container-title:Materials Science Reports

Author:

Tanner B.K.,Bowen D.K.

Publisher

Elsevier BV

Subject

General Engineering

Reference156 articles.

1. The projection topograph: a new method in X-ray diffraction microradiography

2. X-ray Diffraction Topography;Tanner,1976

3. Characterization of Crystal Growth Defects by X-ray Methods,1980

4. Use of synchrotron radiation in X-ray diffraction topography

5. Synchrotron radiation – its application to high-speed, high-resolution X-ray diffraction topography

Cited by 29 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Analysis of dislocation configurations in SiC crystals through X-ray topography aided by ray tracing simulations;Materials Science in Semiconductor Processing;2024-05

2. Dislocation Contrast Analysis in Weak Beam Synchrotron X-Ray Topography;Materials Science Forum;2022-05-31

3. Dislocation contrast on X-ray topographs under weak diffraction conditions;Journal of Applied Crystallography;2021-07-30

4. 2D real space visualization of d values in polycrystalline bulk materials of different hardness;Journal of Applied Crystallography;2021-03-31

5. Simultaneous neutron transmission and diffraction contrast tomography as a non-destructive 3D method for bulk single crystal quality investigations;Journal of Applied Physics;2013-09-28

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