Determination of p-n Junctions in In P/GaInAsP Laser Heterostructures Using a Profilometer
Author:
Publisher
Wiley
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference4 articles.
1. Growth and characterisation of GaInAsP/InP double heterostructure material for stripe-geometry lasers emitting near 1.3μm
2. Zinc contamination and misplaced p-n junctions in InP–GaInPAs d.h. lasers
3. Low Threshold Current Density (100) GaInAsP/InP Double-Heterostructure Lasers for Wavelength 1.3 µm
4. New contact resistance profiling method for the assessment of III–V alloy multilayer structures
Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. From InP/GaInAsP interface study to nanometer range heterostructure detection with probe method;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures;1994-01
2. Improvement of the probe profiling method for InP/GaInAsP structures using Kr+ion bombardment;Applied Physics Letters;1992-06-08
3. Contact resistance profiling of LPE grown GaAs (GaAl) as multilayer structures;Acta Physica Hungarica;1987-04
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