Fourier resolution of surface and interface contributions to photoreflectance spectra of multilayered structures-Reference-Cited by-同舟云学术

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Fourier resolution of surface and interface contributions to photoreflectance spectra of multilayered structures

Published:1995-11-16 Issue:1 Volume:152 Page:113-122
ISSN:0031-8965
Container-title:Physica Status Solidi (a)
language:de
Short-container-title:Phys. Stat. Sol. (a)

Author:

Scheibler H. E.,Alperovich V. L.,Jaroshevich A. S.,Terekhov A. S.

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference23 articles.

1. in: Handbook of Semiconductors, Ed. Vol. 2, North-Holland Publ. Co., Amsterdam 1980 (p. 109).

2. Modulation spectroscopy as a tool for electronic material characterization

3. Modulation spectroscopy in superlattices

4. Photoreflectance characterization of surface Fermi level in as‐grown GaAs(100)

5. Oxidation and annealing of GaAs (100) studied by photoreflectance

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1. Relaxational kinetics of photoemission and photon-enhanced thermionic emission from p-GaAs surface with nonequilibrium Cs overlayers;Applied Surface Science;2018-12

2. Transport and magnetic properties of Fe/GaAs Schottky junctions for spin polarimetry applications;Journal of Applied Physics;2011-06

3. Spectroscopy of systems with time variable parameters: photoreflectance of GaAs(001) under cesium adsorption;Journal of Physics: Condensed Matter;2010-04-15

4. Photoreflectance investigations of quantum well intermixing processes in compressively strained InGaAsP∕InGaAsP quantum well laser structures emitting at 1.55μm;Journal of Applied Physics;2006-07

5. Fourier transformed photoreflectance characterization of interface electric fields in GaAs/GaInP heterojunction bipolar transistor wafers;Journal of Applied Physics;2003-11-15

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