The Pulsed MIS Capacitor. A Critical Review-Reference-Cited by-同舟云学术

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The Pulsed MIS Capacitor. A Critical Review

Published:1985-05-16 Issue:1 Volume:89 Page:13-43
ISSN:0031-8965
Container-title:physica status solidi (a)
language:de
Short-container-title:phys. stat. sol. (a)

Author:

Kang J. S.,Schroder D. K.

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference38 articles.

1. Measurement of Germanium Surface States by Pulsed Channel Effect

2. Energy Levels in Neutron-Irradiatedn-Type Silicon

3. Carrier concentration and minority carrier lifetime measurement in semiconductor epitaxial layers by the mos capacitance method

4. Minority carrier lifetime determination from inversion layer transient response

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