1. and , in: Defects in Semiconductors, Vol. 2, Ed. and , Elsevier, New York 1983 (p. 107).
2. Proc. 13th Internat. Conf. Defects in Semicond., Coronada (California) 1984, Ed. L. C. Kimerling, and J. M. Parsey, Warrendale 1985 (p. 129).
3. Proc. 14th Internat. Conf. Defects in Semicond., Paris 1986, Ed. Aldermannsdorf 1986 (p. 953).
4. Thermal donors and carbonoxygen defects in silicon
5. DLTS study on deep level defects in Cz-p-Si due to heat treatment at 600 to 900 °C