Measurement of X-ray diffraction angles of perfect monocrystals with high accuracy using a single crystal diffractometer-Reference-Cited by-同舟云学术

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Measurement of X-ray diffraction angles of perfect monocrystals with high accuracy using a single crystal diffractometer

Published:1989-10-16 Issue:2 Volume:115 Page:369-382
ISSN:0031-8965
Container-title:Physica Status Solidi (a)
language:de
Short-container-title:Phys. Stat. Sol. (a)

Author:

Härtwig J.,Grosswig S.

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference39 articles.

1. International Tables for Crystallography, Volume C, Ed. A. J. C. WILSON, in preparation.

2. Handbook of X-rays, McGraw-Hill Publ. Co., 1967

3. X-Ray Spectra from a Ruled Reflection Grating

4. Absolute Wave-Lengths of the Copper and ChromiumK-Series

5. The reflection of X-rays by crystals

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